Silicon Wafer - Test Probe Card/Test Harness
About this Artwork:
This is a silicon wafer test probe card, sometimes referred to as a test harness. The probe card is used in a machine, that’s more like a robot, called a wafer prober. The wafer prober uses the microprobe tips on the probe card to activate each chip on the wafer to test its functions. The tips are arranged to contact the silicon wafer in the configuration of the chip’s pads. If the chip failed the test, the prober would use an ink marker to place a dot on the chip to mark it as “bad”. The prober would move the card, or wafer, to test each chip. The probe card is made of heavy-duty fiberglass. Many of the wires and contacts were plated with gold to avoid corrosion and improve connectivity. Each wafer probe card is made uniquely for the chip it is testing.
The background image of this artwork is a test circuit on an HP 1AA7 chip. Standardized test circuits were used to quickly test a wafer. This original artwork was created by photographing an HP 1AA7 silicon computer chip using a microscope and special lighting.
The artwork is framed in an 8"x10" black shadow box frame, with glass. All framing materials are acid-free. A narrative about the artwork that includes the artist’s signature is placed on the back of the artwork.